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Analysis of intensity and frequency noises in semiconductor optical amplifier

机译:半导体光放大器的强度和频率噪声分析

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摘要

A theoretical analysis of the intensity and the frequency noise in semiconductor optical amplifiers (SOA) is given. Amplification of a traveling optical wave is formulated associating with fluctuations on the optical intensity, the optical phase, and the electron numbers based on the classical wave-equation and quantum mechanical modification. Inclusion of the amplified spontaneous emission generated in the SOA is also taken into account. Amounts of noise are expressed in terms of the relative intensity noise (RIN), the spectrum line-width, and the frequency noise. Sensitive dependency of the RIN property on the optical input power is theoretically explained. The RIN increases after passing the SOA, when the optical input power is small enough, but decreases when the optical input power is rather high. On the while, the spectrum line-width is found to be scarcely changed from the input light for conventional operation of the SOA. © 2012 IEEE.
机译:给出了半导体光放大器(SOA)中强度和频率噪声的理论分析。基于经典的波方程和量子力学修正,将行进的光波的放大公式与光强度,光相位和电子数的波动相关联。还应考虑将SOA中生成的放大的自发发射包括在内。噪声量用相对强度噪声(RIN),频谱线宽和频率噪声表示。从理论上解释了RIN属性对光输入功率的敏感依赖性。当光输入功率足够小时,RIN在通过SOA之后增加,但在光输入功率相当高时,RIN降低。同时,对于SOA的常规操作,发现光谱线宽与输入光几乎没有变化。 ©2012 IEEE。

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    Yamada, Minoru;

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  • 年度 2012
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